SSDM 2026: ASME Aerospace Structures, Structural Dynamics, and Materials Conference

Angstrom Scientific

ASME Aerospace Structures, Structural Dynamics, and Materials Conference > Sponsors & Exhibitors > Angstrom Scientific

Angstrom Scientific Inc. represents leading manufacturers supporting materials characterization. Featuring sample prep tools from Leica, including ultra-microtomes and e-beam coaters. Hitachi Tabletop TM 4000P Ser 3 SEM with EDX. We support a wide range of in-situ systems for your SEM from ConnectomX (Katana microtome), NenoVision (AFM), C-sense Self-Sensing Cantilevers, and Alemnis (micro and nano mech test). In addition, for semiconductor failure analysis we have Imina probe systems coupled with Point Electronic EBIC/EBAC. Point Electronic also provides complete SEM modernization. On the TEM side we have EMSIS (Cameras), Insight Chips (TEM liquid cells), Point Electronic STEBIC. Our latest addition to our portfolio is a novel technology from Radalytica (portable robotic X-ray & CT systems) and VacuumFAB (micro positioning stages and switches).